Amazonで購入した SSD が故障したようです。
1年間のメーカー保証が数ヶ月残っているのですが、CFD販売の製品は、
購入店経由で対応とのことで、購入したAmazonに問い合わせするも、
Amazonはメーカーに問い合わせしろと言うし困ったものだ・・・
しかし、Amazonに再度問い合わせると、サポート案内 CFD販売株式会社
のページのメールアドレスに問い合わせること数日で、愛知県の返品センターまで送ることができました。
追記 2011.3.31
商品が修理交換されて返ってきました。
アクセス不能になる直前のスマート情報です。
smartctl 5.40 2010-10-16 r3189 [x86_64-apple-darwin10.6.0] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: C300-MTFDDAC064MAG
Serial Number: 000000001023*******9
Firmware Version: 0002
User Capacity: 64,023,257,088 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Fri Mar 18 10:35:51 2011 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 295) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 4) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 000 Pre-fail Always - 0
5 Reallocated_Sector_Ct 0x0033 100 100 000 Pre-fail Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2510
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 212
170 Unknown_Attribute 0x0033 100 100 000 Pre-fail Always - 4395
171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
173 Unknown_Attribute 0x0033 100 100 000 Pre-fail Always - 26
174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 4629974745429
183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0
184 End-to-End_Error 0x0033 100 100 000 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x000e 100 100 000 Old_age Always - 81
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 1030
202 Data_Address_Mark_Errs 0x0018 100 100 000 Old_age Offline - 0
206 Flying_Height 0x000e 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 0
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 0 occurred at disk power-on lifetime: 2510 hours (104 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
44 51 10 50 3b 2c 40
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 03 10 50 3b 2c 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
61 00 10 d0 3a 2c 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
61 02 10 50 36 2c 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
61 aa 10 c0 32 2c 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
61 03 10 60 1d 29 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
Error -1 occurred at disk power-on lifetime: 2510 hours (104 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
44 51 00 b0 2d e8 40
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 00 00 40 2d e8 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
60 00 00 68 35 e6 40 00 5d+04:36:25.408 READ FPDMA QUEUED
61 00 00 40 2c e8 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
60 10 00 68 34 e6 40 00 5d+04:36:25.408 READ FPDMA QUEUED
61 10 00 40 2b e8 40 00 5d+04:36:25.408 WRITE FPDMA QUEUED
Error -2 occurred at disk power-on lifetime: 2510 hours (104 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
44 51 00 e0 23 e8 e0 Error: WP, ABRT at LBA = 0x00e823e0 = 15213536
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 00 40 23 e8 e0 00 5d+04:36:25.408 WRITE DMA EXT
ef 10 03 00 00 00 00 00 5d+04:36:25.408 SET FEATURES [Reserved for Serial ATA]
ef 10 02 00 00 00 00 00 5d+04:36:25.408 SET FEATURES [Reserved for Serial ATA]
ef 02 00 00 00 00 00 00 5d+04:36:25.408 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 5d+04:36:25.408 SET FEATURES [Enable read look-ahead]
Error -3 occurred at disk power-on lifetime: 1856 hours (77 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
44 51 08 90 cf b9 e3 Error: WP, ABRT at LBA = 0x03b9cf90 = 62508944
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 08 8f cf b9 e3 00 27d+15:34:12.704 WRITE DMA
c8 00 01 00 00 00 e0 00 27d+15:34:12.704 READ DMA
c8 00 01 00 00 00 e0 00 27d+15:34:12.704 READ DMA
c8 00 01 00 00 00 e0 00 27d+15:34:12.704 READ DMA
ca 00 08 8f cf b9 e3 00 27d+15:34:12.704 WRITE DMA
Error -4 occurred at disk power-on lifetime: 1856 hours (77 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
44 51 08 a0 d8 b9 e3 Error: WP, ABRT at LBA = 0x03b9d8a0 = 62511264
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
30 00 08 9f d8 b9 e3 00 27d+15:34:12.704 WRITE SECTOR(S)
30 00 08 07 d8 b9 e3 00 27d+15:34:12.704 WRITE SECTOR(S)
30 00 20 9f d7 b9 e3 00 27d+15:34:12.704 WRITE SECTOR(S)
30 00 08 e7 d4 b9 e3 00 27d+15:34:12.704 WRITE SECTOR(S)
30 00 08 d7 d4 b9 e3 00 27d+15:34:12.704 WRITE SECTOR(S)
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.